Le système portable d'analyse élémentaire PIXE-? réalisé dans le cadre d'une collaboration entre INFN/LANDIS (Catane, Italie) et le CEA LIST (Saclay, France) a été utilisé pour la caractérisation non destructive de fragments de fresques romaines provenant de différents sites archéologiques de Catane. Un diffractomètre (XRD) portable a été également utilisé pour l'identification des différentes phases minérales présentes. Il a été montré que, l'association des deux techniques permet une caractérisation quantitative complète de la surface des échantillons analysés. De plus, l'association des deux techniques PIXE et XRF permet d'avoir une information sur l'arrangement stratigraphique des couches picturales.
In the present work the portable PIXE-? system realized within a collaboration between the INFN/LANDIS (Catania, Italy) and the CEA LIST (Saclay, France) has been used for the non destructive analysis of roman frescoes fragments belonging to different archaeological sites of Catania. Moreover, a portable XRD diffractometer has been used to individuate the mineralogical phases. It is shown that, by combining the two techniques, a fully quantitative analysis of the frescoes surface is possible. It is also shown that, comparing the XRF data to PIXE ones, information on stratigraphic sequence of layers components is possible.
Non-destructive measurements on roman frescoes pigments
F P Romano;
2005
Abstract
In the present work the portable PIXE-? system realized within a collaboration between the INFN/LANDIS (Catania, Italy) and the CEA LIST (Saclay, France) has been used for the non destructive analysis of roman frescoes fragments belonging to different archaeological sites of Catania. Moreover, a portable XRD diffractometer has been used to individuate the mineralogical phases. It is shown that, by combining the two techniques, a fully quantitative analysis of the frescoes surface is possible. It is also shown that, comparing the XRF data to PIXE ones, information on stratigraphic sequence of layers components is possible.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.