Lead zirconate titanate (PZT) films deposited by sol-gel on MgO substrates have been studied by glancing angle X-ray diffraction (GAD) and scanning (SEM) and transmission (TEM) electron microscopy. To study the possibility of growing preferentially oriented films, two different compositions were considered: Pb(Zr0.52Ti0.48)O3 and Pb(Zr0.2Ti0.8)O3. Preliminary results suggest that a preferential orientation occurs depending on the film composition. In particular, a higher Ti content seems to favour the orientation along the [001] direction.
Crystallisation of perovskite PZT films on MgO substrates
BE Watts
1998
Abstract
Lead zirconate titanate (PZT) films deposited by sol-gel on MgO substrates have been studied by glancing angle X-ray diffraction (GAD) and scanning (SEM) and transmission (TEM) electron microscopy. To study the possibility of growing preferentially oriented films, two different compositions were considered: Pb(Zr0.52Ti0.48)O3 and Pb(Zr0.2Ti0.8)O3. Preliminary results suggest that a preferential orientation occurs depending on the film composition. In particular, a higher Ti content seems to favour the orientation along the [001] direction.File in questo prodotto:
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