In the present work the portable PIXE- system realized within a collaboration between the IBAM/CNR, the INFN/LANDIS (Catania, Italy) and the CEA/LIST (Saclay, France) has been used, in combination with the upgraded XRD diffractometer, for non destructive analysis. It is shown that, by combining the two techniques, quantitative analysis is possible in selected cases. Application to Roman frescoes fragments coming from different archaeological sites of Catania (Italy) is presented.
The complementary use of PIXE-alfa and XRD non destructive portable system for the quantitative analysis of painted surface
2007
Abstract
In the present work the portable PIXE- system realized within a collaboration between the IBAM/CNR, the INFN/LANDIS (Catania, Italy) and the CEA/LIST (Saclay, France) has been used, in combination with the upgraded XRD diffractometer, for non destructive analysis. It is shown that, by combining the two techniques, quantitative analysis is possible in selected cases. Application to Roman frescoes fragments coming from different archaeological sites of Catania (Italy) is presented.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
