The paper presents an experimental method useful to characterize a multiport circuit, in particular a MEMS (Micro-Electro-Mechanical System) matrix, using a two-port VNA (Vector Network Analyzer). As example, the method is applied for a four-port circuit (a coupler). The results obtained by using this method and the expected results obtained by simulation are in good agreement.

On-wafer method for experimental characterization of MEMS matrix, using a two-port Vector Network Analyzer

R Marcelli;
2009

Abstract

The paper presents an experimental method useful to characterize a multiport circuit, in particular a MEMS (Micro-Electro-Mechanical System) matrix, using a two-port VNA (Vector Network Analyzer). As example, the method is applied for a four-port circuit (a coupler). The results obtained by using this method and the expected results obtained by simulation are in good agreement.
2009
Istituto per la Microelettronica e Microsistemi - IMM
978-973-27-1813-1
RF MEMS
multi-port measurements
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/139302
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