The paper presents an experimental method useful to characterize a multiport circuit, in particular a MEMS (Micro-Electro-Mechanical System) matrix, using a two-port VNA (Vector Network Analyzer). As example, the method is applied for a four-port circuit (a coupler). The results obtained by using this method and the expected results obtained by simulation are in good agreement.

On-wafer method for experimental characterization of MEMS matrix, using a two-port Vector Network Analyzer

R Marcelli;
2009

Abstract

The paper presents an experimental method useful to characterize a multiport circuit, in particular a MEMS (Micro-Electro-Mechanical System) matrix, using a two-port VNA (Vector Network Analyzer). As example, the method is applied for a four-port circuit (a coupler). The results obtained by using this method and the expected results obtained by simulation are in good agreement.
2009
Istituto per la Microelettronica e Microsistemi - IMM
Inglese
George Konstantinidis, Alexandru Muller, Dan Dascalu and Robert Plana
New Developments in Micro Electro Mechanical Systems for Radio Frequency and Millimeter Wave Applications
363
370
8
978-973-27-1813-1
http://www.nano-link.net/mne/
Editura Academiei Române
Bucuresti
ROMANIA
Sì, ma tipo non specificato
RF MEMS
multi-port measurements
5
02 Contributo in Volume::02.01 Contributo in volume (Capitolo o Saggio)
268
none
Simion, S; Marcelli, R; Barlolucci, G; Sajin, G; Craciunoiu, F
info:eu-repo/semantics/bookPart
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/139302
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact