Measurements by X-ray micro-diffractometer on the surface of Sm1Ba2Cu3O7-x superconducting thin films produced by pulsed laser deposition are reported. The X-ray results are discussed as a function of the uniformity of structural surface and crystal defects.

Structural surface analysis of Sm1Ba2Cu3O7-x thin film by pulsed laser deposition

Medici L;Morone A
2006

Abstract

Measurements by X-ray micro-diffractometer on the surface of Sm1Ba2Cu3O7-x superconducting thin films produced by pulsed laser deposition are reported. The X-ray results are discussed as a function of the uniformity of structural surface and crystal defects.
2006
Istituto di Nanotecnologia - NANOTEC
Istituto di Metodologie per l'Analisi Ambientale - IMAA
GROWTH
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/144796
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