Focused ion beam was utilized to locally modify magnetism and structure of L1_0 FePt perpendicular thin films. As a first step, we have performed a magnetic, morphological, and structural study of completely irradiated FePt films with different Ga+ doses (1 x 10^13 - 4 x 10^16 ions/cm^2) and ion beam energy of 30 keV. For doses of 1 x 10^14 ions/cm. and above a complete transition from the ordered L1_0 to the disordered A1 phase was found to occur, resulting in a drop of magnetic anisotropy and in the consequent moment reorientation from out-of-plane to in-plane. The lowest effective dose in disordering the structure (1 x 10^14 ions/cm^2) was found not to affect the film morphology. Taking advantage of these results, continuous two-dimensional (2D) patterns of perpendicular magnetic structures (250 nm dots, 1 micron dots, 1 micron-large stripes) were produced by focused ion beam without affecting the morphology. The 2D patterns were revealed by means of magnetic force microscopy, that evidenced peculiar domain structures in the case of 1 micron dots.
Local modifications of magnetism and structure in FePt (001) epitaxial thin films by focused ion beam: Two-dimensional perpendicular patterns
Gazzadi GC b;
2008
Abstract
Focused ion beam was utilized to locally modify magnetism and structure of L1_0 FePt perpendicular thin films. As a first step, we have performed a magnetic, morphological, and structural study of completely irradiated FePt films with different Ga+ doses (1 x 10^13 - 4 x 10^16 ions/cm^2) and ion beam energy of 30 keV. For doses of 1 x 10^14 ions/cm. and above a complete transition from the ordered L1_0 to the disordered A1 phase was found to occur, resulting in a drop of magnetic anisotropy and in the consequent moment reorientation from out-of-plane to in-plane. The lowest effective dose in disordering the structure (1 x 10^14 ions/cm^2) was found not to affect the film morphology. Taking advantage of these results, continuous two-dimensional (2D) patterns of perpendicular magnetic structures (250 nm dots, 1 micron dots, 1 micron-large stripes) were produced by focused ion beam without affecting the morphology. The 2D patterns were revealed by means of magnetic force microscopy, that evidenced peculiar domain structures in the case of 1 micron dots.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
