FePt thin films were epitaxially grown by RF sputtering on MgO ( 1 0 0) substrates at 550 degrees C, followed by in situ annealing at the same temperature. The in situ annealing was found to improve the magnetic characteristics: i.e., the increase in magnetic squareness up to 0.9 and increase in the ratio between anisotropy and coercivity (epsilon = anisotropy field/coercive field = 35.9 for 115 min annealing). Remarkably, a decrease in grain size was also found to occur by increasing the annealing time. (c) 2007 Elsevier B.V. All rights reserved.
Grain size reduction and magnetic properties improvement by in situ annealing of FePt epitaxial thin films
Albertini F;Nasi L;Casoli F;Fabbrici S;Luches P;Valeri S
2007
Abstract
FePt thin films were epitaxially grown by RF sputtering on MgO ( 1 0 0) substrates at 550 degrees C, followed by in situ annealing at the same temperature. The in situ annealing was found to improve the magnetic characteristics: i.e., the increase in magnetic squareness up to 0.9 and increase in the ratio between anisotropy and coercivity (epsilon = anisotropy field/coercive field = 35.9 for 115 min annealing). Remarkably, a decrease in grain size was also found to occur by increasing the annealing time. (c) 2007 Elsevier B.V. All rights reserved.File in questo prodotto:
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