We studied the neutral electronic excitations of NiO localized at the Ni sites by measuring the resonant inelastic x-ray scattering (RIXS) spectra at the Ni M2;3 edges. The good energy resolution allows an unambiguous identification of several spectral features due to dd excitations. The dependence of the RIXS spectra on the excitation energy gives evidence of local spin flip and yields a value of 125 15 meV for the antiferromagnetic exchange interaction. Accurate crystal field parameters are also obtained.
Localized Electronic Excitations in NiO Studied with Resonant Inelastic X-Ray Scattering at the NiMThreshold: Evidence of Spin Flip
Ghiringhelli G;
2005
Abstract
We studied the neutral electronic excitations of NiO localized at the Ni sites by measuring the resonant inelastic x-ray scattering (RIXS) spectra at the Ni M2;3 edges. The good energy resolution allows an unambiguous identification of several spectral features due to dd excitations. The dependence of the RIXS spectra on the excitation energy gives evidence of local spin flip and yields a value of 125 15 meV for the antiferromagnetic exchange interaction. Accurate crystal field parameters are also obtained.File in questo prodotto:
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