We present a 5 m long spectrometer for soft x rays to be used at a synchrotron radiation beamline for resonant x-ray emission spectroscopy and resonant inelastic x-ray scattering in the 400-1600 eV energy range. It is based on a variable line spacing spherical grating average groove density of 3200 mm-1, R=58.55 m and a charge coupled device two dimensional detector. With an x-ray spot on the sample of 10 m, the targeted resolving power is higher than 10 000 at all energies below 1100 eV and better than 7000 at 1500 eV. The off-line tests made with Al and Mg K1,2 fluorescence emissions indicate that the spectrometer can actually work at 12 000 and 17 000 resolving power at the L3 edges of Cu 930 eV and of Ti 470 eV, respectively. SAXES superadvanced x-ray emission spectrometer is mounted on a rotating platform allowing to vary the scattering angle from 25° to 130°. The spectrometer will be operational at the ADRESS advanced resonant spectroscopies beamline of the Swiss Light Source from 2007.
SAXES, a high resolution spectrometer for resonant x-ray emission in the 400-1600 eV energy range
Ghiringhelli G;
2006
Abstract
We present a 5 m long spectrometer for soft x rays to be used at a synchrotron radiation beamline for resonant x-ray emission spectroscopy and resonant inelastic x-ray scattering in the 400-1600 eV energy range. It is based on a variable line spacing spherical grating average groove density of 3200 mm-1, R=58.55 m and a charge coupled device two dimensional detector. With an x-ray spot on the sample of 10 m, the targeted resolving power is higher than 10 000 at all energies below 1100 eV and better than 7000 at 1500 eV. The off-line tests made with Al and Mg K1,2 fluorescence emissions indicate that the spectrometer can actually work at 12 000 and 17 000 resolving power at the L3 edges of Cu 930 eV and of Ti 470 eV, respectively. SAXES superadvanced x-ray emission spectrometer is mounted on a rotating platform allowing to vary the scattering angle from 25° to 130°. The spectrometer will be operational at the ADRESS advanced resonant spectroscopies beamline of the Swiss Light Source from 2007.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
