The shape evolution and the effect of deposition temperature on size and composition of chemical vapor deposition grown Ge/Si(100) islands have been investigated in the deposition temperature range 450–850 °C. It is found that the increase of the growth temperature above 600 °C entails a strong island enlargement due to an increased Si/Ge intermixing. The crystallographic structure of the islands was investigated by transmission electron microscopy. The analysis of the resulting Moire´ pattern reveals that the island lattice deformation decreases with increasing island size and that the effective mismatch e between the silicon substrate and the epilayer decreases with increasing deposition temperature. The island nucleation size, the mean size of coherent islands and the critical size for the insertion of misfit dislocations have been found to scale as e-2, e-2, and e-1, respectively. The agreement of our experimental scaling results with the predictions of theoretical calculation performed for homogeneous heterostructures suggests that, although the Si distribution inside the islands is not homogeneous, the island growth is driven by the mean effective strain.

Intermixing-promoted scaling of Ge/Si(100) island sizes

F Evangelisti;
2002

Abstract

The shape evolution and the effect of deposition temperature on size and composition of chemical vapor deposition grown Ge/Si(100) islands have been investigated in the deposition temperature range 450–850 °C. It is found that the increase of the growth temperature above 600 °C entails a strong island enlargement due to an increased Si/Ge intermixing. The crystallographic structure of the islands was investigated by transmission electron microscopy. The analysis of the resulting Moire´ pattern reveals that the island lattice deformation decreases with increasing island size and that the effective mismatch e between the silicon substrate and the epilayer decreases with increasing deposition temperature. The island nucleation size, the mean size of coherent islands and the critical size for the insertion of misfit dislocations have been found to scale as e-2, e-2, and e-1, respectively. The agreement of our experimental scaling results with the predictions of theoretical calculation performed for homogeneous heterostructures suggests that, although the Si distribution inside the islands is not homogeneous, the island growth is driven by the mean effective strain.
2002
Istituto di fotonica e nanotecnologie - IFN
Istituto per la Microelettronica e Microsistemi - IMM
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/151529
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact