Photoelectron emission spectra in a photon energy range between 7.5 and 21 eV are measured for in situ grown polycrystalline Yb films. By comparing bulk and surface core level shifted 4f components we give an estimation of the effective attenuation length (EAL) for low energy (6-20 eV) electrons in Yb, establishing a moderate increase of the EAL upon electron energy decrease. The experimental EAL data are found to be a factor of four smaller than those predicted from the so-called 'universal curve'.
The attenuation length of low energy electrons in Yb
S Iacobucci;G Panaccione
2010
Abstract
Photoelectron emission spectra in a photon energy range between 7.5 and 21 eV are measured for in situ grown polycrystalline Yb films. By comparing bulk and surface core level shifted 4f components we give an estimation of the effective attenuation length (EAL) for low energy (6-20 eV) electrons in Yb, establishing a moderate increase of the EAL upon electron energy decrease. The experimental EAL data are found to be a factor of four smaller than those predicted from the so-called 'universal curve'.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
