Matrix effects in SIMS analysis of light elements (H, Li, Be, B and F) have been investigated in phenacite, kornerupine, danburite, axinite, spodumene, tourmaline, hambergite and mica, epoxy-mounted in a known crystallographic orientation relative to the primary-ion beam. As reference chemical information, we used data from EMPA and single-crystal structure-refinement (SREF) on the same crystals used for SIMS. Quantification of secondary-ion intensities into concentrations was done using Si as the reference matrix-element. The results indicate that matrix effects due to crystallographic orientation are < 10% relative, or below analytical uncertainty for most analyzed elements. In dioctahedral mica, there is a difference in IY(H/Si) of ~ 25% relative when the crystal is analyzed parallel and orthogonal to the main cleavage (i.e. perpendicular to the c-axis). The magnitude of this effect is significant and higher than our SIMS inaccuracy for H in micas: ± 10% rel. Among the analyzed elements, Be is least affected by matrix effects, even when present as a major element. The most significant chemical SIMS effects on H, Li, F and B in silicates seem to be related to the Fe (+ Mn) content of the matrix: the light-element IY decreases as the Fe (+ Mn) content increases, as previously seen in tourmaline, axinite and kornerupine. Si and Al seem to have complementary and opposite effects on IY with respect to Fe and Mn. The agreement between SIMS and SREF is close for most light elements when they are present as major constituents. The results of our study also show that analytical problems are still present for B by EMPA, and this technique may not be adequate to accurately measure B in some minerals.
SIMS matrix effects in the analysis of light elements in silicate minerals: Comparison with SREF and EMPA data
Ottolini L;
2002
Abstract
Matrix effects in SIMS analysis of light elements (H, Li, Be, B and F) have been investigated in phenacite, kornerupine, danburite, axinite, spodumene, tourmaline, hambergite and mica, epoxy-mounted in a known crystallographic orientation relative to the primary-ion beam. As reference chemical information, we used data from EMPA and single-crystal structure-refinement (SREF) on the same crystals used for SIMS. Quantification of secondary-ion intensities into concentrations was done using Si as the reference matrix-element. The results indicate that matrix effects due to crystallographic orientation are < 10% relative, or below analytical uncertainty for most analyzed elements. In dioctahedral mica, there is a difference in IY(H/Si) of ~ 25% relative when the crystal is analyzed parallel and orthogonal to the main cleavage (i.e. perpendicular to the c-axis). The magnitude of this effect is significant and higher than our SIMS inaccuracy for H in micas: ± 10% rel. Among the analyzed elements, Be is least affected by matrix effects, even when present as a major element. The most significant chemical SIMS effects on H, Li, F and B in silicates seem to be related to the Fe (+ Mn) content of the matrix: the light-element IY decreases as the Fe (+ Mn) content increases, as previously seen in tourmaline, axinite and kornerupine. Si and Al seem to have complementary and opposite effects on IY with respect to Fe and Mn. The agreement between SIMS and SREF is close for most light elements when they are present as major constituents. The results of our study also show that analytical problems are still present for B by EMPA, and this technique may not be adequate to accurately measure B in some minerals.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
