We report on the fabrication, by a 26 MHz stretched-cavity femtosecond Ti:sapphire oscillator, of optical waveguides in different glass substrates, and their optical characterization. Operation of these waveguides in the telecom range at 1.55 ¼m is demonstrated. Digital holography microscopy is used to measure their refractive index profile. The results evidence a strong dependence of the fabrication process on the glass matrix.

Optical properties of waveguides written by a 26 MHz stretched cavity Ti:sapphire femtosecond oscillator

Osellame R;De Nicola S;Ferraro P;Finizio A;Pierattini G
2005

Abstract

We report on the fabrication, by a 26 MHz stretched-cavity femtosecond Ti:sapphire oscillator, of optical waveguides in different glass substrates, and their optical characterization. Operation of these waveguides in the telecom range at 1.55 ¼m is demonstrated. Digital holography microscopy is used to measure their refractive index profile. The results evidence a strong dependence of the fabrication process on the glass matrix.
2005
Istituto di Scienze Applicate e Sistemi Intelligenti "Eduardo Caianiello" - ISASI
Istituto di fotonica e nanotecnologie - IFN
Istituto Nazionale di Ottica - INO
laser-pulses
photonic devices
repetition-rate
glass fabrication
silica
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/154381
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