Metal oxide thin films have been deposited on Si(1 0 0) substrates by reactive pulsed laser ablation of metallic target--titanium, tungsten--in the presence of a 13.56 MHz radio frequency (RF) plasma, 10 Pa static atmosphere of O2, using a doubled frequency Nd:YAG laser. The gaseous species were collected on Si(1 0 0) substrates positioned in front of the target on a heatable holder, up to 1000 K. The deposited thin films were analyzed by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The comparison between conventional pulsed laser deposition (PLD) and the RF plasma-assisted PLD showed the influence of the plasma on the surface roughness, and a better adhesion to the substrates by the plasma-aided thin films.

Thin films deposition in RF plasma by reactive pulsed laser ablation

V Marotta;A Morone;S Orlando;
2002

Abstract

Metal oxide thin films have been deposited on Si(1 0 0) substrates by reactive pulsed laser ablation of metallic target--titanium, tungsten--in the presence of a 13.56 MHz radio frequency (RF) plasma, 10 Pa static atmosphere of O2, using a doubled frequency Nd:YAG laser. The gaseous species were collected on Si(1 0 0) substrates positioned in front of the target on a heatable holder, up to 1000 K. The deposited thin films were analyzed by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The comparison between conventional pulsed laser deposition (PLD) and the RF plasma-assisted PLD showed the influence of the plasma on the surface roughness, and a better adhesion to the substrates by the plasma-aided thin films.
2002
Istituto di Struttura della Materia - ISM - Sede Roma Tor Vergata
Reactive pulsed laser deposition
RF plasma
Oxides
Thin films
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/15605
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