The structural and electronic properties of MnxGe1-x alloys (x <= 0.15) fabricated by ion implantation are investigated by means of x-ray diffraction and synchrotron radiation photoemission spectroscopy. The diffraction patterns point to the presence of ferromagnetic Mn5Ge3 nanoparticles; however, valence band spectra, interpreted by means of accurate ab initio calculations including Hubbard-like correlations, show clear fingerprints of an effective substitutional Mn dilution in the Ge semiconducting host. (c) 2006 American Institute of Physics.

Phase separation and dilution in implanted MnxGe1-x alloys

Picozzi S;Impellizzeri G;Priolo F
2006

Abstract

The structural and electronic properties of MnxGe1-x alloys (x <= 0.15) fabricated by ion implantation are investigated by means of x-ray diffraction and synchrotron radiation photoemission spectroscopy. The diffraction patterns point to the presence of ferromagnetic Mn5Ge3 nanoparticles; however, valence band spectra, interpreted by means of accurate ab initio calculations including Hubbard-like correlations, show clear fingerprints of an effective substitutional Mn dilution in the Ge semiconducting host. (c) 2006 American Institute of Physics.
2006
INFM
Inglese
88
061907-1
061907-3
3
http://dx.doi.org/10.1063/1.2171485
Sì, ma tipo non specificato
FERROMAGNETIC SEMICONDUCTOR
GE(111)
3
info:eu-repo/semantics/article
262
Ottaviano, L; Passacantando, M; Picozzi, S; Continenza, A; Gunnella, R; Verna, A; Bihlmayer, G; Impellizzeri, G; Priolo, F
01 Contributo su Rivista::01.01 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/156464
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