YBa2Cu3O7-x bicrystal dc-superconducting quantum interference devices (SQUIDs) and single layer magnetometers working at 77 K have been fabricated and analyzed. Samples have been made in situ by cylindrical magnetron dc sputtering on [001] SrTiO3 bicrystal substrates. Magnetic flux noise levels and magnetic field sensitivities by standard flux-locked-loop electronics have been measured out on dc-SQUIDs and magnetometers, respectively. Flux noise levels as low as a few ??0Hz-1/2 in the white noise regime have been measured in SQUIDs, whereas the magnetic field sensitivity of the magnetometers was influenced by external sources. A comparison of experimental data with analytical expressions modelling the behavior of high Tc SQUIDs has been carried out, with special reference to the flux-to-voltage transfer parameter and noise characteristics. Finally, a reduction of 1/f noise of the SQUIDs has been achieved by a wide band bias reversal electronics.

Low 1/f Noise in Sputtered YBa2Cu3O7-x Bicrystal dc-SQUIDs

E Sarnelli;C Camerlingo;M Russo;G Torrioli;MG Castellano
1997-01-01

Abstract

YBa2Cu3O7-x bicrystal dc-superconducting quantum interference devices (SQUIDs) and single layer magnetometers working at 77 K have been fabricated and analyzed. Samples have been made in situ by cylindrical magnetron dc sputtering on [001] SrTiO3 bicrystal substrates. Magnetic flux noise levels and magnetic field sensitivities by standard flux-locked-loop electronics have been measured out on dc-SQUIDs and magnetometers, respectively. Flux noise levels as low as a few ??0Hz-1/2 in the white noise regime have been measured in SQUIDs, whereas the magnetic field sensitivity of the magnetometers was influenced by external sources. A comparison of experimental data with analytical expressions modelling the behavior of high Tc SQUIDs has been carried out, with special reference to the flux-to-voltage transfer parameter and noise characteristics. Finally, a reduction of 1/f noise of the SQUIDs has been achieved by a wide band bias reversal electronics.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/15736
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact