a-Si1-xNx:H thin films grown by PECVD in a wide compositional range were characterized by spectroscopic ellipsometry and Mach-Zehnder interferometry. Taking advantage from their optical properties, the alloys were fruitfully applied for stratified structures such as distributed Bragg reflectors, conventional and double resonance optical microcavities. (c) 2006 Elsevier B.V. All rights reserved.
Amorphous Silicon Nitride: a suitable alloy for optical multilayered structures
Lettieri S;Maddalena P;
2006
Abstract
a-Si1-xNx:H thin films grown by PECVD in a wide compositional range were characterized by spectroscopic ellipsometry and Mach-Zehnder interferometry. Taking advantage from their optical properties, the alloys were fruitfully applied for stratified structures such as distributed Bragg reflectors, conventional and double resonance optical microcavities. (c) 2006 Elsevier B.V. All rights reserved.File in questo prodotto:
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