This work reports the application of a patterned thin film of polyisobutylene (PIB) irradiated with an electron beam as a time-temperature integrator, i.e., a device that is able to record the thermal history of a product. The device is fabricated by irradiation with an electron beam of regions of a PIB thin film to different doses of electrons. A different dewetting behavior occurs at these regions upon thermal exposure, depending on the dose. The experimental results are quantified by means of a model of dewetting based on nucleation and growth of holes in a strong slippage regime.

Time-Temperature Integrator Based on the Dewetting of Polyisobutylene Thin Films

Stoliar P;Matacotta FC;Cavallini M;Biscarini F
2010

Abstract

This work reports the application of a patterned thin film of polyisobutylene (PIB) irradiated with an electron beam as a time-temperature integrator, i.e., a device that is able to record the thermal history of a product. The device is fabricated by irradiation with an electron beam of regions of a PIB thin film to different doses of electrons. A different dewetting behavior occurs at these regions upon thermal exposure, depending on the dose. The experimental results are quantified by means of a model of dewetting based on nucleation and growth of holes in a strong slippage regime.
2010
Istituto di Struttura della Materia - ISM - Sede Roma Tor Vergata
Istituto per lo Studio dei Materiali Nanostrutturati - ISMN
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/158960
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