The structural evolution of cobalt nanoclusters synthesized in silica glass by ion implantation has been investigated upon thermal annealing. The samples were characterized by in-situ grazing incidence X-ray diffraction, exploiting a synchrotron radiation beam and following their evolution during thermal treatments in vacuo up to T=800 degrees C. Before heating, the system is composed of hcp Co nanocrystals; we have not detected the transition from hcp to fcc structure that in the bulk phase occurs around 420 degrees C; nevertheless, the differences in the diffraction pattern recorded at T=800 degrees C with respect to the corresponding one at room temperature suggest the presence of a second crystalline phase. (c) 2006 Elsevier B.V. All rights reserved.

Thermal evolution of cobalt nanocrystals embedded in silica

Maurizio C;D'Acapito F;Vomiero A
2007

Abstract

The structural evolution of cobalt nanoclusters synthesized in silica glass by ion implantation has been investigated upon thermal annealing. The samples were characterized by in-situ grazing incidence X-ray diffraction, exploiting a synchrotron radiation beam and following their evolution during thermal treatments in vacuo up to T=800 degrees C. Before heating, the system is composed of hcp Co nanocrystals; we have not detected the transition from hcp to fcc structure that in the bulk phase occurs around 420 degrees C; nevertheless, the differences in the diffraction pattern recorded at T=800 degrees C with respect to the corresponding one at room temperature suggest the presence of a second crystalline phase. (c) 2006 Elsevier B.V. All rights reserved.
2007
INFM
Istituto Officina dei Materiali - IOM -
X-RAY-DIFFRACTION
ION-IMPLANTATION
MAGNETIC-PROPERTIES
SYNCHROTRON-RADIATION
FINE PARTICLES
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/163669
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