Large transverse thermoelectric and photon-drag signals in the infrared have been previously observed in semimetal films of Bi and Sb evaporated at large angles with the substrate normal. In this work by analysing the behaviour of both signals versus the evaporation angle, the thickness and the radiation wavelength we can deduce a model for the anisotropy induced by the transverse evaporation.

Thermoelectric and Photon-Drag Signals in Anisotropic Thin Semimetal Films

MARCHETTI S;SIMILI R;D'AMATO F;
1989

Abstract

Large transverse thermoelectric and photon-drag signals in the infrared have been previously observed in semimetal films of Bi and Sb evaporated at large angles with the substrate normal. In this work by analysing the behaviour of both signals versus the evaporation angle, the thickness and the radiation wavelength we can deduce a model for the anisotropy induced by the transverse evaporation.
1989
Istituto Nazionale di Ottica - INO
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/174440
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