We have fabricated and studied a stacked superconducting double tunnel junction device with transistor-like properties. The intermediate electrode is a bilayer consisting of a Nb film together with an Al film that acts as a quasiparticle trap. Large current gains of more than 50 are observed at 4.2 K when the Al layer is normal. The operation is highly directional. Results are explained on the basis of trapping of quasiparticles from a superconductor into a normal metal, together with a conversion of relaxation energy into electronic excitations. Similar devices should have wide applications in low-temperature measurement and detection systems

Superconducting device with transistor-like properties including large current amplification

2000

Abstract

We have fabricated and studied a stacked superconducting double tunnel junction device with transistor-like properties. The intermediate electrode is a bilayer consisting of a Nb film together with an Al film that acts as a quasiparticle trap. Large current gains of more than 50 are observed at 4.2 K when the Al layer is normal. The operation is highly directional. Results are explained on the basis of trapping of quasiparticles from a superconductor into a normal metal, together with a conversion of relaxation energy into electronic excitations. Similar devices should have wide applications in low-temperature measurement and detection systems
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/176276
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