The challenge for the commercialization of YBCO Coated Conductors (CC) is the development of a low cost manufacturing process to allow for a cheap, fast and continuous deposition of superconducting coatings with high electrical performances. We are currently investigating 2 ways to reduce the CC production costs: i) reducing the complexity of the CC architecture, by growing a single buffer layer based on doped CeO2, and ii) utilizing a new reel-to-reel apparatus for long length CC processing, equipped with a cheap and reliable deposition system (PED, Pulsed Electron Deposition). In this work we report on the successful continuous deposition of very thick (up to 700 nm) doped-CeO2 single buffer layers on biaxially textured Ni-5at%W substrates by PED. XRD pattern displays complete orientation and very good texture quality of our samples (FWHM out-of-plane values of ? 6°), over 20 cm length. Optical and electron microscopy show a dense and crack-free film surface and dielectric strength measurement confirms excellent insulating properties. Preliminary results indicates that the simplified single buffer layer structure could be a reliable solution for the reduction of HTS CC production costs.
Pulsed Electron Deposition (PED) of Single Buffer Layer for "low-cost" YBCO Coated Conductors
Edmondo Gilioli
2007
Abstract
The challenge for the commercialization of YBCO Coated Conductors (CC) is the development of a low cost manufacturing process to allow for a cheap, fast and continuous deposition of superconducting coatings with high electrical performances. We are currently investigating 2 ways to reduce the CC production costs: i) reducing the complexity of the CC architecture, by growing a single buffer layer based on doped CeO2, and ii) utilizing a new reel-to-reel apparatus for long length CC processing, equipped with a cheap and reliable deposition system (PED, Pulsed Electron Deposition). In this work we report on the successful continuous deposition of very thick (up to 700 nm) doped-CeO2 single buffer layers on biaxially textured Ni-5at%W substrates by PED. XRD pattern displays complete orientation and very good texture quality of our samples (FWHM out-of-plane values of ? 6°), over 20 cm length. Optical and electron microscopy show a dense and crack-free film surface and dielectric strength measurement confirms excellent insulating properties. Preliminary results indicates that the simplified single buffer layer structure could be a reliable solution for the reduction of HTS CC production costs.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.