La-modified PbTiO3 (PLT) thin films of different composition (Pb1-3x/2LaxTiO3 , x=0.15 and 0.20) were characterized by Piezoresponse Force Microscopy (PFM). 001/100-textured films were deposited on (111)Pt/TiO2/SiO2/(100)Si by Pulsed Laser Deposition (PLD). The spontaneous polarization domain structure was correlated with the grain microstructure and orientation texture. The area ratio between the 001 and -001 antiparallel polarization domains was estimated. Additionally, the local piezoelectric behavior in PLT (x=0.15) films was characterized.
Ferroelectric domain structure and local piezoelectric properties of La-modified PbTiO3 thin films prepared by pulsed laser deposition
Labardi M;
2002
Abstract
La-modified PbTiO3 (PLT) thin films of different composition (Pb1-3x/2LaxTiO3 , x=0.15 and 0.20) were characterized by Piezoresponse Force Microscopy (PFM). 001/100-textured films were deposited on (111)Pt/TiO2/SiO2/(100)Si by Pulsed Laser Deposition (PLD). The spontaneous polarization domain structure was correlated with the grain microstructure and orientation texture. The area ratio between the 001 and -001 antiparallel polarization domains was estimated. Additionally, the local piezoelectric behavior in PLT (x=0.15) films was characterized.File in questo prodotto:
| File | Dimensione | Formato | |
|---|---|---|---|
|
prod_215201-doc_49773.pdf
non disponibili
Descrizione: Ferroelectric domain structure and local piezoelectric properties of La-modified PbTiO3 thin films prepared by pulsed laser deposition
Dimensione
505.34 kB
Formato
Adobe PDF
|
505.34 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
