X-ray photoelectron spectroscopy (XPS), X-ray induced Auger electron spectroscopy (XAES) and secondary ion mass spectrometry (SIMS) have been used to investigate segregation phenomena at fracture surfaces of thermal treated (up to 1460°C) 25.5CeO2-2.5Y2O3-72ZrO2 (percentages by weight) plasma sprayed thermal barrier coatings (TBC). The results show that segregation of bulk dissolved impurities and of yttrium stabilizing oxide, takes place at the fracture surfaces starting from 900°C. The chemical nature of the segregated phase is ascribable to an infinite chain silicate of sodium and yttrium with the presence of aluminium and iron at a temperature equal to and higher than 1100°C. SIMS ion images show further that aluminium segregates both at the silicate segregated regions as well as separately. The effect of these segregation phenomena on the properties of the TBC's is discussed. © 1993.

COMBINED USE OF XPS, XAES AND SIMS FOR THE CHARACTERIZATION OF FRACTURE SURFACES OF CEO2-Y2O3-ZRO2 COATINGS

GM Ingo
1993

Abstract

X-ray photoelectron spectroscopy (XPS), X-ray induced Auger electron spectroscopy (XAES) and secondary ion mass spectrometry (SIMS) have been used to investigate segregation phenomena at fracture surfaces of thermal treated (up to 1460°C) 25.5CeO2-2.5Y2O3-72ZrO2 (percentages by weight) plasma sprayed thermal barrier coatings (TBC). The results show that segregation of bulk dissolved impurities and of yttrium stabilizing oxide, takes place at the fracture surfaces starting from 900°C. The chemical nature of the segregated phase is ascribable to an infinite chain silicate of sodium and yttrium with the presence of aluminium and iron at a temperature equal to and higher than 1100°C. SIMS ion images show further that aluminium segregates both at the silicate segregated regions as well as separately. The effect of these segregation phenomena on the properties of the TBC's is discussed. © 1993.
1993
Istituto per lo Studio dei Materiali Nanostrutturati - ISMN
Air pressure plasma spray
Fracture surfaces
Secondary ion mass spectrometry (SIMS)
Thermal barrier coatings (TBC)
X ray photoelectron spectroscopy (XPS)
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/179193
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