Short-length prototypes of coated conductors consisting of YBa2Cu3O7-x/yttrium-stabilized zirconia (YBCO/YSZ) bilayers have been fabricated by pulsed laser deposition (PLD) onto biaxially textured NiFe substrates. Scanning probe microscopy has been used for a detailed investigation of local sample properties. In particular, near-field scanning optical microscopy has been exploited to reconstruct a high resolution map of the surface optical scattering properties, which can be related to fluctuations of oxygen stoichiometry at the grain space scale.
Near-field microscopy investigation of laser-deposited coated conductors
Coppede N;Labardi M;
2003
Abstract
Short-length prototypes of coated conductors consisting of YBa2Cu3O7-x/yttrium-stabilized zirconia (YBCO/YSZ) bilayers have been fabricated by pulsed laser deposition (PLD) onto biaxially textured NiFe substrates. Scanning probe microscopy has been used for a detailed investigation of local sample properties. In particular, near-field scanning optical microscopy has been exploited to reconstruct a high resolution map of the surface optical scattering properties, which can be related to fluctuations of oxygen stoichiometry at the grain space scale.File in questo prodotto:
| File | Dimensione | Formato | |
|---|---|---|---|
|
prod_214959-doc_49699.pdf
non disponibili
Descrizione: Near-field microscopy investigation of laser-deposited coated conductors
Dimensione
188.32 kB
Formato
Adobe PDF
|
188.32 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.


