We report on a method for surface plasmon resonance (SPR) refractive index sensing based on direct time-domain measurements. An optical resonator is built around an SPR sensor, and its photon lifetime is measured as a function of loss induced by refractive index variations. The method does not rely on any spectroscopic analysis or direct intensity measurement. Time-domain measurements are practically immune to light intensity fluctuations and thus lead to high resolution. A proof of concept experiment is carried out in which a sensor response to liquid samples of different refractive indices is measured. A refractive index resolution of the current system, extrapolated from the reproducibility of cavity-decay time determinations over 133 s, is found to be about 10-5 RIU. The possibility of long-term averaging suggests that measurements with a resolution better than 10-7 RIU/?Hz are within reach.

Surface plasmon resonance optical cavity enhanced refractive index sensing

A Giorgini;S Avino;P Malara;G Gagliardi;M Casalino;G Coppola;M Iodice;P De Natale
2013

Abstract

We report on a method for surface plasmon resonance (SPR) refractive index sensing based on direct time-domain measurements. An optical resonator is built around an SPR sensor, and its photon lifetime is measured as a function of loss induced by refractive index variations. The method does not rely on any spectroscopic analysis or direct intensity measurement. Time-domain measurements are practically immune to light intensity fluctuations and thus lead to high resolution. A proof of concept experiment is carried out in which a sensor response to liquid samples of different refractive indices is measured. A refractive index resolution of the current system, extrapolated from the reproducibility of cavity-decay time determinations over 133 s, is found to be about 10-5 RIU. The possibility of long-term averaging suggests that measurements with a resolution better than 10-7 RIU/?Hz are within reach.
2013
Istituto per la Microelettronica e Microsistemi - IMM
Istituto per la Microelettronica e Microsistemi - IMM
Istituto Nazionale di Ottica - INO
Istituto Nazionale di Ottica - INO
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/187424
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