Two different Sb-induced phases have been found upon annealing on freshly evaporated Si(100)2 x 1 surfaces. The surface electronic structures of the two phases (1 x 1-Sb and 2 x 1-Sb) have been studied with surface differential reflectivity (SDR) and angle-resolved photoelectron spectroscopy (ARUPS). Both techniques show the existence of a gap of approximately 1.6 and 1.4 eV for the two phases, with the empty state located near the Fermi level.

ELECTRONIC STATES ON SI(100)2X1-SB - EXISTENCE OF 2 SEMICONDUCTING PHASES

A Cricenti;S Selci;L Ferrari;
1993

Abstract

Two different Sb-induced phases have been found upon annealing on freshly evaporated Si(100)2 x 1 surfaces. The surface electronic structures of the two phases (1 x 1-Sb and 2 x 1-Sb) have been studied with surface differential reflectivity (SDR) and angle-resolved photoelectron spectroscopy (ARUPS). Both techniques show the existence of a gap of approximately 1.6 and 1.4 eV for the two phases, with the empty state located near the Fermi level.
1993
86
10
667
670
http://biblioproxy.cnr.it:2052/science/article/pii/003810989390836C
Sì, ma tipo non specificato
SCANNING TUNNELING MICROSCOPY
SPECTROSCOPY
SURFACES
SILICON
SB
3
info:eu-repo/semantics/article
262
A. Cricenti; S. Selci; A.C. Felici; L. Ferrari; G. Chiarotti
01 Contributo su Rivista::01.01 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/188677
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