We have investigated possible mechanisms for conduction in high-Tc thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density SV(f) is proportional to the DC voltage .
Mechanisms for conduction via low-frequency noise measurements of high-Tc thin-film microbridges
Davidson BA;
1995
Abstract
We have investigated possible mechanisms for conduction in high-Tc thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density SV(f) is proportional to the DC voltage .File in questo prodotto:
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