Structural and optical properties of Y2-xErxSi2O7 thin films have been studied. For higher Er content mechanisms related to Er-Er interactions increase optical efficiency. Moreover the influence of up-conversion has been estimated.

Er 3+ excitation and up-conversion processes in Y 2- x Er x Si 2 O 7 films for planar optical amplifiers

Miritello M;Priolo;
2009

Abstract

Structural and optical properties of Y2-xErxSi2O7 thin films have been studied. For higher Er content mechanisms related to Er-Er interactions increase optical efficiency. Moreover the influence of up-conversion has been estimated.
2009
Istituto per la Microelettronica e Microsistemi - IMM
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/197770
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