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Structural and optical properties of Y2-xErxSi2O7 thin films have been studied. For higher Er content mechanisms related to Er-Er interactions increase optical efficiency. Moreover the influence of up-conversion has been estimated.

Er 3+ excitation and up-conversion processes in Y 2- x Er x Si 2 O 7 films for planar optical amplifiers

Miritello M;Priolo;
2009

Abstract

Structural and optical properties of Y2-xErxSi2O7 thin films have been studied. For higher Er content mechanisms related to Er-Er interactions increase optical efficiency. Moreover the influence of up-conversion has been estimated.
2009
Istituto per la Microelettronica e Microsistemi - IMM
Inglese
Group IV Photonics, 2009. GFP '09. 6th IEEE International Conference on
61
62
2
IEEE
New York
STATI UNITI D'AMERICA
Sì, ma tipo non specificato
9-11 Sept. 2009
San Francisco (USA)
5
none
Miritello, M; Lo Savio, R; Cardile, P; Priolo, Francesco; F,
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/197770
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