The surface characterization of semiconductors is conducted using surface enhanced Raman scattering (SERS) by evaporating an Ag island film onto the surface of the materials. The surface sensitivity of the Raman effect at the metal surface is used for the study of molecules absorbed onto the semiconductors. It is indicated that with this method, there is enhanced Raman scattering from the surface because of the discontinuous Ag layer produces large electromagnetic enhancement at each Ag particle. SERS spectra are observed from tri(bipyridine)ruthenium, Ru(bpy)32+ molecules adsorbed on Si, GaAs, InP, silver, and glass substrates onto which an Ag island film is evaporated.
Raman spectroscopy of adsorbates on semiconductors by means of SERS effect
LG Quagliano;
1995
Abstract
The surface characterization of semiconductors is conducted using surface enhanced Raman scattering (SERS) by evaporating an Ag island film onto the surface of the materials. The surface sensitivity of the Raman effect at the metal surface is used for the study of molecules absorbed onto the semiconductors. It is indicated that with this method, there is enhanced Raman scattering from the surface because of the discontinuous Ag layer produces large electromagnetic enhancement at each Ag particle. SERS spectra are observed from tri(bipyridine)ruthenium, Ru(bpy)32+ molecules adsorbed on Si, GaAs, InP, silver, and glass substrates onto which an Ag island film is evaporated.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
