Synchrotron radiation ultraviolet photoemission spectroscopy (UPS) of O(2s) core levels, valence band (VB) and Sn(4d) spectroscopy was used to monitor the effect of Ar+ sputtering on SnO2 films. The decrease of the O(2s) peak intensity and the increase of the Sn2+ component in the Sn(4d) peak could be satisfactorily correlated with the enhancement of the band gap feature, occurring at 2.9 eV in the VB spectrum,never been due to the formation of Sn(5s-5p) states.
Synchrotron radiation photoelectron spectroscopy of the O(2s) core level as a tool for monitoring the reducing effects of ion bombardment on SnO2 thin films
P De Padova;R Larciprete;C Ottaviani;C Quaresima;P Perfetti;C Crotti;M Zacchigna;
1996
Abstract
Synchrotron radiation ultraviolet photoemission spectroscopy (UPS) of O(2s) core levels, valence band (VB) and Sn(4d) spectroscopy was used to monitor the effect of Ar+ sputtering on SnO2 films. The decrease of the O(2s) peak intensity and the increase of the Sn2+ component in the Sn(4d) peak could be satisfactorily correlated with the enhancement of the band gap feature, occurring at 2.9 eV in the VB spectrum,never been due to the formation of Sn(5s-5p) states.File in questo prodotto:
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