Epitaxial (001)-oriented ultrathin YBCO films of different thicknesses are deposited by Inverted Cylindrical Magnetron Sputtering (ICMS) on (100) MgO single-crystal substrates. The mean films stoichiometry is determined by Rutherford Backscattering (RBS). Auger Electron Spectroscopy (AES), X-ray Photoemission Spectroscopy (XPS) and Scanning Electron Microscopy (SEM) are employed in order to analyse film growth, and identify spurious phases present in the samples.
STRUCTURAL AND MORPHOLOGICAL PROPERTIES OF ULTRATHIN YBCO FILMS GROWN ON SINGLE-CRYSTAL SUBSTRATES
GRANOZIO;VALENTINO M;IL;
1994
Abstract
Epitaxial (001)-oriented ultrathin YBCO films of different thicknesses are deposited by Inverted Cylindrical Magnetron Sputtering (ICMS) on (100) MgO single-crystal substrates. The mean films stoichiometry is determined by Rutherford Backscattering (RBS). Auger Electron Spectroscopy (AES), X-ray Photoemission Spectroscopy (XPS) and Scanning Electron Microscopy (SEM) are employed in order to analyse film growth, and identify spurious phases present in the samples.File in questo prodotto:
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