Results concerning the study of the morphology and the surface chemical properties of epitaxial YBCO and highly oriented TBCCO films before and after wet etching processes are reported. X-ray photoemission spectroscopy, Auger electron spectroscopy and scanning electron microscopy are employed to get information on the surface contamination and on the defects of the samples. The chemical modifications of surfaces and the shape of etch pits are discussed.

Morphology and surface properties of YBCO and TBCCO thin films: Influence of etching processes

Granozio;Valentino M;IL;
1996

Abstract

Results concerning the study of the morphology and the surface chemical properties of epitaxial YBCO and highly oriented TBCCO films before and after wet etching processes are reported. X-ray photoemission spectroscopy, Auger electron spectroscopy and scanning electron microscopy are employed to get information on the surface contamination and on the defects of the samples. The chemical modifications of surfaces and the shape of etch pits are discussed.
1996
Inglese
271
1-2
83
93
http://www.sciencedirect.com/science/article/pii/S092145349600545X
Sì, ma tipo non specificato
CHEMICAL-VAPOR-DEPOSITION
SINGLE-CRYSTALS
YBA2CU3O7-X
GROWTH
MICROSTRUCTURE
ULTRATHIN
DEFECTS
DEPENDENCE
ENERGIES
MGO
3
info:eu-repo/semantics/article
262
Granozio; FM;diUccio; US;Valentino M;Condorelli; GG;Fragala; IL;Malandrino; G
01 Contributo su Rivista::01.01 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/200756
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