An optical setup is specially developed to explore the basic optical properties of quantum wells and other quantum structures. The optical scheme, basically a cross double beam reflectometer, is based on a spectrograph equipped with a linear photodiode array. This arrangement allows an almost simultaneous record of the most relevant spectroscopic features using different techniques like reflectance, photoluminescence, and photoreflectance. Because of unneeded grating repositioning, a direct comparison of absolute positions for structures of spectra taken with different techniques can be made within instrument resolution (Delta E approximate to 0.15 meV @ 800 nm). Successful results by the use of this apparatus for GaAs/InGaAs and AlGaAs/GaAs samples are documented.

Experimental multi-techniques apparatus for optical properties of quantum structures

Ferrari L;Selci S
1995

Abstract

An optical setup is specially developed to explore the basic optical properties of quantum wells and other quantum structures. The optical scheme, basically a cross double beam reflectometer, is based on a spectrograph equipped with a linear photodiode array. This arrangement allows an almost simultaneous record of the most relevant spectroscopic features using different techniques like reflectance, photoluminescence, and photoreflectance. Because of unneeded grating repositioning, a direct comparison of absolute positions for structures of spectra taken with different techniques can be made within instrument resolution (Delta E approximate to 0.15 meV @ 800 nm). Successful results by the use of this apparatus for GaAs/InGaAs and AlGaAs/GaAs samples are documented.
1995
SURFACE DIFFERENTIAL REFLECTIVITY
PHOTOREFLECTANCE
SI(100)2X1-SB
STATES
GAAS
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/200793
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