X-ray photoelectron spectroscopy (XPS) and x-ray induced Auger electron spectroscopy have been used to study borosilicate glasses of various iron oxide contents. The iron is present as both Fe(II) and Fe(III) ions, and its distribution between the two oxidation states appears to be constant throughout the series of samples. 01s XPS spectra and OKVV Auger spectra show that the iron ions separate between iron oxide phases and iron silicate phases. The extent of this separation was measured by quantitative XPS analysis.
XPS STUDIES OF IRON SODIUM BOROSILICATE GLASSES
Elisabetta Agostinelli;Dino Fiorani;Ernesto Paparazzo
1987
Abstract
X-ray photoelectron spectroscopy (XPS) and x-ray induced Auger electron spectroscopy have been used to study borosilicate glasses of various iron oxide contents. The iron is present as both Fe(II) and Fe(III) ions, and its distribution between the two oxidation states appears to be constant throughout the series of samples. 01s XPS spectra and OKVV Auger spectra show that the iron ions separate between iron oxide phases and iron silicate phases. The extent of this separation was measured by quantitative XPS analysis.File in questo prodotto:
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