We have applied extended x-ray absorption fine structure (EXAFS) spectroscopy to the K edge of rare earths (RE) in a study of the local environments of diluted Er and Yb dopants in silicate glasses, prepared by sol-gel processing. Silica-titania-alumina glasses, doped with RE ions at and above the luminescence quenching concentration were investigated and EXAFS spectra were recorded in a wide k range up to 160 nm(-1) not obtainable when working at the L-III edge. No direct RE-RE correlations were found, providing a strong support for previous studies. A model of RE aggregation derived from these observations is also discussed.

Local environment of rare-earth dopants in silica-titania-alumina glasses: An extended x-ray absorption fine structure study at the K edges of Er and Yb

2001

Abstract

We have applied extended x-ray absorption fine structure (EXAFS) spectroscopy to the K edge of rare earths (RE) in a study of the local environments of diluted Er and Yb dopants in silicate glasses, prepared by sol-gel processing. Silica-titania-alumina glasses, doped with RE ions at and above the luminescence quenching concentration were investigated and EXAFS spectra were recorded in a wide k range up to 160 nm(-1) not obtainable when working at the L-III edge. No direct RE-RE correlations were found, providing a strong support for previous studies. A model of RE aggregation derived from these observations is also discussed.
2001
Istituto Officina dei Materiali - IOM -
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/202028
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