Near-edge X-ray absorption fine structure (NEXAFS) studies of oxygen interaction with thin films of polycristalline cesium show the evolution of different Cs oxides with increasing oxygen exposure. Multiple scattering calculations indicate that the system prepared by co-deposition of Cs and oxygen at 120 K has a CsO2 structure and that the resonance at about 537 eV corresponds to scattering events involving the oxygen in the O2- form with an O-O bond length of 1.40+/-0.05 angstrom.
Oxygen K-edge NEXAFS studies of thin Cs oxide films
M Pedio;
1992
Abstract
Near-edge X-ray absorption fine structure (NEXAFS) studies of oxygen interaction with thin films of polycristalline cesium show the evolution of different Cs oxides with increasing oxygen exposure. Multiple scattering calculations indicate that the system prepared by co-deposition of Cs and oxygen at 120 K has a CsO2 structure and that the resonance at about 537 eV corresponds to scattering events involving the oxygen in the O2- form with an O-O bond length of 1.40+/-0.05 angstrom.File in questo prodotto:
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