We describe an X-ray phase imaging technique able to detect micro and macrodefects on SIG. This technique enables investigation of thick samples, not accessible to light transmission microscopy and provides additional information on the defects.
Coherent X-ray imaging investigation of macrodefects and micropipes on SiC
Milita S;
1999
Abstract
We describe an X-ray phase imaging technique able to detect micro and macrodefects on SIG. This technique enables investigation of thick samples, not accessible to light transmission microscopy and provides additional information on the defects.File in questo prodotto:
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