Abstract -- The paper presents an experimental method useful to characterize a multiport circuit, in particular a MEMS (M icro-Electro-Mechanical System) matrix, using a two-port VNA (V ector Network Analyzer). As example, the method is applied for a four-port circuit (a coupler). The results obtained by using this method and the expected results obtained by simulation are in good agreement.

On-wafer method for experimental characterization of MEMS matrix, using a two-port Vector Network Analyzer

R Marcelli;
2008

Abstract

Abstract -- The paper presents an experimental method useful to characterize a multiport circuit, in particular a MEMS (M icro-Electro-Mechanical System) matrix, using a two-port VNA (V ector Network Analyzer). As example, the method is applied for a four-port circuit (a coupler). The results obtained by using this method and the expected results obtained by simulation are in good agreement.
2008
Istituto per la Microelettronica e Microsistemi - IMM
Inglese
Editor: George Konstantinidis
Proceedings of the 9th International Symposium on RF MEMS and RF Microsystems, MEMSWAVE 2008
9th International Symposium on RF MEMS and RF Microsystems, MEMSWAVE 2008
4
http://books.google.it/books/about/MEMSWAVE_2008.html?id=7pC8jwEACAAJ&redir_esc=y
Sì, ma tipo non specificato
30th June - 3rd July 2008
Heraklion, Greece
Network Analyzer Measurements
Multi-Port Devices
5
none
Simion, S; Marcelli, R; Barlolucci, G; Sajin, G; Craciunoiu, F
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/206491
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