Critical currents determine noise properties of current biased high critical temperature thin films. Manifestations of critical currents depend on microstructure of the investigated film and on the mechanism of noise generation. Therefore, the analysis of the telegraph voltage noise amplitudes dependence on current flow provides an insight into the details of physical mechanism responsible for noise emissions.
Random Telegraph Noise and Critical Currents of High-T-c Superconducting Thin Films
Vecchione A;
1994
Abstract
Critical currents determine noise properties of current biased high critical temperature thin films. Manifestations of critical currents depend on microstructure of the investigated film and on the mechanism of noise generation. Therefore, the analysis of the telegraph voltage noise amplitudes dependence on current flow provides an insight into the details of physical mechanism responsible for noise emissions.File in questo prodotto:
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