The electronic structure and bond properties of a lattice defect in silicon formed by the incomplete recombination of a vacancy-interstitial pair are described by combining tight-binding molecular-dynamics and ab-initio Hartree-Fock calculations. The defect structure consists of a large nuclear distortion nearly perfectly compensated by electron charge rearrangment. The reaction path for its annihilation is reported and described in terms of an electron-density topological analysis within the quantum theory of atoms in molecules approach
Formation and annihilation of a bond defect in silicon: An ab initio quantum-mechanical characterization
F Cargnoni;C Gatti;
1998
Abstract
The electronic structure and bond properties of a lattice defect in silicon formed by the incomplete recombination of a vacancy-interstitial pair are described by combining tight-binding molecular-dynamics and ab-initio Hartree-Fock calculations. The defect structure consists of a large nuclear distortion nearly perfectly compensated by electron charge rearrangment. The reaction path for its annihilation is reported and described in terms of an electron-density topological analysis within the quantum theory of atoms in molecules approachFile in questo prodotto:
| File | Dimensione | Formato | |
|---|---|---|---|
|
prod_239397-doc_72298.pdf
solo utenti autorizzati
Descrizione: Formation and annihilation of a bond defect in silicon: An ab initio quantum-mechanical characterization
Dimensione
230.51 kB
Formato
Adobe PDF
|
230.51 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.


