We present a determination of surface dielectric functions (SDF) of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained using polarized surface differential reflectivity (SDR) technique.
Dielectric functions of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained by polarized surface differential reflectivity
Selci S;Cricenti A;
1987
Abstract
We present a determination of surface dielectric functions (SDF) of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained using polarized surface differential reflectivity (SDR) technique.File in questo prodotto:
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