We present a new method for producing extremely sharp tungsten tips needed for Scanning Tunneling Microscopy studies. A lateral resolution less than 1 Å has been achieved in air on cleaved graphite samples.
Shaping of tungsten tips for scanning tunneling microscope
Cricenti A;Selci S;Generosi R;
1989
Abstract
We present a new method for producing extremely sharp tungsten tips needed for Scanning Tunneling Microscopy studies. A lateral resolution less than 1 Å has been achieved in air on cleaved graphite samples.File in questo prodotto:
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