By means of CCD-camera pictures, the physical phenomenon behind switching in antiferroelectric liquid crystal displays is investigated. The addressing scheme of Nippondenso is used. During the line addressing period, fast homogeneous switching takes place. During the rest of the frame time under the holding voltage, slow domain wall motion takes place.

Experimental Investigation of Domain Wall Motion and Switching in Antiferroelectric Liquid Crystal Displays

R Beccherelli
1999

Abstract

By means of CCD-camera pictures, the physical phenomenon behind switching in antiferroelectric liquid crystal displays is investigated. The addressing scheme of Nippondenso is used. During the line addressing period, fast homogeneous switching takes place. During the rest of the frame time under the holding voltage, slow domain wall motion takes place.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/209899
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact