The morphological and electrical characterization of transparent nanostructured LiNbO3-SiO2 thin films synthesized by a novel sol-gel route is reported. Films annealed at different temperatures exhibit different size of the nanocrystals, as demonstrated by Atomic Force Microscopy and Glancing Incidence X-ray diffraction. The dc electrical measurements performed on planar devices reveal electrical bistability. A clear relationship between the electrical bistability and the size of LiNbO3 nanocrystals embedded in the matrix is observed.

Novel sol-gel synthesis of transparent and electrically bistable LiNbO 3-SiO2 nanocomposites thin films

Aruta C;
2009

Abstract

The morphological and electrical characterization of transparent nanostructured LiNbO3-SiO2 thin films synthesized by a novel sol-gel route is reported. Films annealed at different temperatures exhibit different size of the nanocrystals, as demonstrated by Atomic Force Microscopy and Glancing Incidence X-ray diffraction. The dc electrical measurements performed on planar devices reveal electrical bistability. A clear relationship between the electrical bistability and the size of LiNbO3 nanocrystals embedded in the matrix is observed.
2009
Atomic force microscopy
Nanocomposites
Nanocrystals
Silica
Sol-gel process
X ray diffraction
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/211522
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 1
  • ???jsp.display-item.citation.isi??? ND
social impact