The morphological and electrical characterization of transparent nanostructured LiNbO3-SiO2 thin films synthesized by a novel sol-gel route is reported. Films annealed at different temperatures exhibit different size of the nanocrystals, as demonstrated by Atomic Force Microscopy and Glancing Incidence X-ray diffraction. The dc electrical measurements performed on planar devices reveal electrical bistability. A clear relationship between the electrical bistability and the size of LiNbO3 nanocrystals embedded in the matrix is observed.

Novel sol-gel synthesis of transparent and electrically bistable LiNbO 3-SiO2 nanocomposites thin films

Aruta C;
2009

Abstract

The morphological and electrical characterization of transparent nanostructured LiNbO3-SiO2 thin films synthesized by a novel sol-gel route is reported. Films annealed at different temperatures exhibit different size of the nanocrystals, as demonstrated by Atomic Force Microscopy and Glancing Incidence X-ray diffraction. The dc electrical measurements performed on planar devices reveal electrical bistability. A clear relationship between the electrical bistability and the size of LiNbO3 nanocrystals embedded in the matrix is observed.
2009
Inglese
49
1
106
111
http://www.scopus.com/inward/record.url?eid=2-s2.0-65049092188&partnerID=40&md5=cf0c83a2121da438f3e673157df581df
Sì, ma tipo non specificato
Atomic force microscopy
Nanocomposites
Nanocrystals
Silica
Sol-gel process
X ray diffraction
1
info:eu-repo/semantics/article
262
Marenna E;Aruta C;Bontempi E;Cassinese A;Colombi P;Depero; L E;Pernice P;Aronne; A
01 Contributo su Rivista::01.01 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/211522
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