We have studied two-dimensional and three-dimensional CoSi2 epitaxial layers on Si(111) by polarization-dependent surface extended x-ray-absorption fine structure on the Co K edge (7707 eV). The Co interface atoms are coordinated with eight Si atoms, as in bulk CoSi2, with an interface bond length of 2.35(0.03) A. Ultrathin three-dimensional CoSi2 layers are 2.5% contracted in the direction perpendicular to the interface.

Evidence of Eighfold Coordination of Co/Si(111) Interface

P De Padova;
1989

Abstract

We have studied two-dimensional and three-dimensional CoSi2 epitaxial layers on Si(111) by polarization-dependent surface extended x-ray-absorption fine structure on the Co K edge (7707 eV). The Co interface atoms are coordinated with eight Si atoms, as in bulk CoSi2, with an interface bond length of 2.35(0.03) A. Ultrathin three-dimensional CoSi2 layers are 2.5% contracted in the direction perpendicular to the interface.
1989
Istituto di Struttura della Materia - ISM - Sede Roma Tor Vergata
EXAFS
CoSi2
Si(111)
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/211576
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