We have performed a photoemission study of the Schottky barrier obtained by depositing Ag onto UHV cleaved GaP( 110) at room temperature. The barrier appears to be fully developed at a coverage of - 2 monolayers and its height is 1.1 eV. This figure is to be compared with higher (lower) values obtained with metals having a larger (smaller) work function than Ag, for example Cu and Au (In and AI) deposited onto the same surface. The result corroborates the idea that the metal-GaP ( 110) interface is a good example of the Schottky limit in metalsemiconductor junctions.

Schottky-like behavior of the GaP(110)/Ag

1989

Abstract

We have performed a photoemission study of the Schottky barrier obtained by depositing Ag onto UHV cleaved GaP( 110) at room temperature. The barrier appears to be fully developed at a coverage of - 2 monolayers and its height is 1.1 eV. This figure is to be compared with higher (lower) values obtained with metals having a larger (smaller) work function than Ag, for example Cu and Au (In and AI) deposited onto the same surface. The result corroborates the idea that the metal-GaP ( 110) interface is a good example of the Schottky limit in metalsemiconductor junctions.
1989
7
23
195
http://scitation.aip.org/docserver/fulltext/avs/journal/jvstb/7/2/1.584715.pdf?expires=1383067237&id=id&accname=429646&checksum=0E8B42B3060B7A9E1AD7E3B0F32F201C
1
info:eu-repo/semantics/article
262
P. Chiaradia; M. Fanfoni; P. Nataletti; P. DePadova; R. E. Viturro;L. J. Brillson
01 Contributo su Rivista::01.01 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/211588
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